Our four-point probes are essential for accurate measurement and testing in semiconductor research and production. Designed for precision and consistency, these probes ensure reliable data collection and analysis.
Learn more about our Four Point Probes for superior testing accuracy.

MPP’s 4PP are commonly used in applications such as:

  • Resistivity measurement of silicon wafers
  • 4-point measurement of epitaxial, ion-implanted and defused layers.
  • 4-point measurement of metallic and other thin films.

MPP’s Probe Head Features and Advantages:

  • Low friction motion of pins using Ruby guides
  • A wide range of probe tip radii and needle spacings
  • Individual needle pressure adjustment (50-200 grf.)
  • High breakdown voltage with low leakage
  • Tungsten Carbide or
  • Osmium Alloy needle tips
  • Variety of probe head designs (Fell, Aluminum, more…)
  • Additional customization available
  • Refurbishment program available

4 points probes leading supplier

MPP is a leading supplier of Four Point Probe (4PP) heads for measurement of resistivity on wafers and on thin conductive films with 40 years of experience and expertise. All the probe parts head assemblies (body, wiring and needles) are produced internally, on MPP’s own high precision customized equipment, and then assembled and tested in house.
Our probe heads have been used for many years all over the world on the most well-known wafer resistivity measuring equipment – KLA Tencor, Kokusai, Napson and other table top equipment. We offer:
  • High quality 4 points Probe Heads with best in class dynamic performances
  • High accuracy & repeatability
  • Strict QC/QA approach
  • Short Lead Time
  • Certified re-furbished option
  • Excellent engineering & product support
  • Best cost performance solution